@inproceedings{ PEREZ_Maldonado_ACAL_Ruiz-Castro_ALONSO_AGUILERA_JIMENEZ_Wenger_ROLDAN,

author = { E. PEREZ and D. Maldonado and CHRISTIAN JOSE ACAL GONZALEZ and Juan Eloy Ruiz-Castro and FRANCISCO JAVIER ALONSO MORALES and ANA MARIA AGUILERA DEL PINO and FRANCISCO JIMENEZ MOLINOS and Ch. Wenger and JUAN B. ROLDAN ARANDA } ,

title = { Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs. },

booktitle = { 21th Conference on `Insulating Films on Semiconductors¿. },

year = { 2019 },

pages = { None - None },

location = { Cambridge (UK) },

}